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How Can I Decrease Test Time in High-Channel-Count Applications?

Posted by Grady Keeton on Apr 26, 2019 1:44:33 PM

When performing functional tests, keeping test times as short as possible is often a critical requirement. Time is money, after all. One way to reduce test times is to reduce the latency in setting up signal switch paths, stimulus devices, and measurements. These can all have a significant impact on the overall time it takes to complete a full functional test of a particular DUT. 

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Topics: automotive testing, Compliance Testing, defense testing

AMETEK Introduces the RX0424, an All-New Rugged Accelerometer Instrument

Posted by Jon Semancik on Feb 12, 2019 9:39:37 AM

AMETEK VTI's new RX0424 IEPE/Voltage Instrument is a cost-effective new device that is ideal for measuring acceleration forces and sensing static and dynamic movement or vibrations. Fully-integrated IEPE current excitation and tachometer input channels further enhance the instrument’s utility and functionality.

The RX0424’s precise signal path design delivers laboratory-grade measurements to the field. The RX4024 provides exceptional accuracy and repeatability by using independent 24-bit analog-to-digital converters at programmable data acquisition rates up to 204.8 kSa per second. Multiple input ranges help ensure that users capture all vibration events, large or small, and precision

The RX4024 connects directly to Integrated Electronic Piezoelectric (IEPE) transducers, which have a built-in charge amplifier or voltage amplifier. IEPE current excitation sources can be programmed to supply either 4.5 mA or 10 mA drive current. These sources can also be tailored to specific application demands.

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Topics: Compliance Testing, defense testing

FlexSys™ test platform speeds test development

Posted by Bill Martin on Jan 19, 2018 10:16:13 AM

FlexSysAMETEK’s FlexSys™ core ATE system provides a standardized test platform that enables test system engineers to jump start the development cycle. FlexSys is a fully documented platform that includes the test fixturing required to connect to complex devices under test (DUTs) and the test instrumentation needed to provide the test stimulus and make test measurements. A standard configuration includes:

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Topics: ATE, defense testing, FlexSys

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